Nicholas G. Paulter

Security and Technology Group
National Institute of Standards and Technology (NIST), Gaithersburg, MD, US

Metrology of Security and Safety Technologies


A discussion of the measurement science associated with the assessment of the performance of the technologies used to ensure public safety and security is presented.  This will include the development and evaluation of text artifacts, development of test and evaluation methods, and the development of documentary standards, all illustrated with actual applications.

Presenter Bio

Nicholas G. Paulter Jr. is the Group Leader for the Security Technologies Group at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD.  He develops and oversees metrology programs related to concealed-weapon detection, through-wall surveillance, traffic control devices, imaging for security and emergency response applications, biometrics for identification, and weapon output characterization.  Prior to that position, he was the Project Leader for the High-Speed Pulse Metrology Project at NIST. In that capacity, he developed several high-speed electrical pulse generation and sampling systems, electro-optic based measurement systems, and short optical pulse laser systems for use in pulse metrology.   From 1980 to 1989, Mr. Paulter was with Los Alamos National Laboratory, Los Alamos, NM, and was involved in the study of fast electrical and optical phenomena.  He has authored or co-authored over 100 peer-reviewed technical articles and provided numerous presentations at a variety of technical conferences. He is a 2008-2009 Commerce Science and Technology Fellow and a 2010 IEEE Fellow.